Agilent Technologies Inc. announced that it has shipped its 8.4 software release with enhanced capabilities for the Medalist 5DX Automated X-ray Inspection (AXI) system.

End-users of the industry-leading 5DX can benefit from the following major AXI enhancements:

• Specialised new algorithm, allowing for inspection of quad-flat no-lead (QFN) with reduced false call rates;
• Defect characterisation on non-wetted Direct FET (field-effect transistor) by using an open slope paste test, which was not possible previously; and
• A new threshold that enables end-users to inspect for solder presence along the side edges of a capacitor, in addition to the current capability for inspection at the ends of a capacitor.

“This release brings with it not just bug fixes but real enhancements to the 5DX platform,” said Peter Chipman, test manager at NBS Design and a veteran 5DX user. “I have been working with the new QFN algorithm extensively and have caught some defects with this new algorithm family. I am also using the new additions to the paste algorithm family. I think this will be another powerful addition to the 5DX inspection capabilities.”

Agilent’s 8.4 software release demonstrates the company’s continued innovation and commitment to improving X-ray inspection. Agilent is the imaging market leader with its fully automated 3-D X-ray inspection system, and has been in the AXI business for more than 10 years, producing six generations of automated X-ray products.

Availability
Agilent customers on valid support contracts will receive CDs of the 8.4 software free of charge for easy upgrade to their systems. 5DX users with questions can find more information about the 8.4 software for the Medalist 5DX Automated X-ray Inspection system online at www.agilent.com/see/axi.