White Paper: Does your CIS design meet its specifications?

Device noise is a key limiter in CMOS image sensors (CIS) performance. Analog FastSPICE™ Transient Noise analysis is the industry’s only full-spectrum device noise analysis for non-periodic circuits like ADCs. Enabling it to deliver silicon accurate results.

With Analog FastSPICE™ Transient Noise analysis, designers can verify the impact of random device noise on the readout circuitry, including ADCs and comparators.

Want to learn more? Download this whitepaper to see why Analog FastSPICE™ Transient Noise analysis is ideal for transistor-level verification of CIS blocks.

Download the White Paper


Mentor, a Siemens Business


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