PODCAST: Automating inspection and utilizing AI – how will it affect test engineers? at IPC APEX EXPO 2019

The test landscape is changing. SPI, AOI and x-ray systems provide much of the intelligence that drives the production equipment on the factory floor. Future systems will be even more intelligent, gathering more data and include automatic programming and integrated inspection analysis. This panel will discuss what this means for the test engineer?

Panel: Satoshi  Otaki (SAKI), Brian D’Amico (MIRTEC), Joel Scutchfield (Koh Young), Richard Osborne (OMRON)

#ipcapexexpo #ipcapex #ipc #ipcapex2019

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