Multi-function JTAG Board Tester fits into ECT (Xcerra) Fixtures
JTAG Technologies is pleased to announce a new co-operation with Everett Charles Technologies (ECT) a world-wide leading name in PCB test fixtures and interface components. JTAG and ECT have just completed a successful integration of their JT 5705/FXT multi-function JTAG tester into the small linear series of cassette-based re-configurable fixtures.
The JT 5705/FXT is a compact (yet complete) single-board test system that supports analog measurement and stimulus, frequency measurements, digital I/O, boundary-scan testing (via two TAPs) and also in-system device programming – the latest JTAG software also includes multiple controller support that allows the linking of multiple units to create a homogeneous system of increased channel counts. Within the fixture The JT 5705/FXT cards mount on purpose built carriers featuring the ATE industry standard 208-pin ‘Pylon’ connectors.
Many new electronic designs feature some devices such as programmable logic and micro-controllers/SOCs that feature JTAG, however due to mixed signal nature of most of these designs it is useful to have mix of test signals to provide analog stimuli and measurement, digital I/O channels and so on. The JT 5705/FXT provides just these features.
Dave Burrows European Manager at ECT comments – ‘we were delighted to work with such a renowned technology leader on this recent project. The uptake of JTAG/Boundary-scan is increasing with our customers and we see this approach to ATE building as a ideal fit in many low-medium cost projects.’
In the ECT small linear series access to the Unit Under Test (UUT) is provided through spring probes/nails that are part of a ‘swappable’ interface module often referred to as a cassette. The cassette links the resources within the fixture-tester (power, tester signals, auxiliary instruments etc) to the UUT. By swapping cassettes different board types can be tested on the same base hardware – providing a cost effective solution especially for high-mix low series volume organisations. What’s more customisation of the tester’s FPGA kernel allows users to develop their own digital I/O options such as CAN bus, counter/timer or high-speed memory access. IP from sharing sites such as Open Cores can be implemented in the FPGA fabric and accessed via JTAG Technologies’ own CoreCommander FPGA translator module.
As the boundary-scan market expands beyond the traditional high-density digital targets, so the test equipment must evolve to match. As well as supporting two JTAG (IEEE 1149.x) compatible TAPs with programmable thresholds the JT 5705 unit has extensive I/O capability (64 channels) 8 of which can be defined as analog with a measure and stimulus range of ±16V or 0-32V. Multiple JT 5705s can be ‘linked and sync’ed’ to provide higher TAP and IO channel counts.
Peter van den Eijnden, MD of JTAG Technologies comments ‘Industrial controls/automation and automotive electronics are just two examples where we expect to see a high demand for this type of product. A great many ECUs require an analog/sensor stimulus which registers back to a microprocessor where the values can be checked using boundary-scan or JTAG emulative test methods – as supported by JTAG Technologies CoreCommander tools.’