Akrometrix Answers the industry’s demand for an ultra-fast tabletop warpage metrology system just in time for productronica
Akrometrix, LLC, the provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, will display its newest warpage metrology system in Hall A3, Stand 102/1 at productronica 2017, scheduled to take place Nov. 14 – 17, 2017 at the Messe München, in Germany. The new Tabletop Shadow Moiré (TTSM) system offers all of the software features of Akrometrix’s thermal warpage metrology systems in a room temperature unit which provides full field-of-view measurement in less than two seconds.
Akrometrix is not only the industry leader in providing thermal warpage, but has optional modules for both DIC strain/CTE measurements and DFP for discontinuous surfaces. Utilizing a novel combination of both top and bottom heaters with shadow moiré, Akrometrix is providing temperature uniformity previously unattainable in the industry on a flexible/configurable platform.
The TTSM responds to the industry’s demand for an ultra-fast tabletop warpage metrology system. It enables customers to measure warpage of substrates up to 300mm x 310mm (a 300mm wafer or two JEDEC trays) with the entire measurement taking less than two seconds. Whether individual parts or a JEDEC tray of multiple parts, the TTSM provides an ultra-fast and highly accurate measurement at room temperature that is suited for tabletop use.
For more information about Akrometrix’s warpage metrology systems, please contact email@example.com or visit www.akrometrix.com.