Preview for JTAG Technologies for the Automotive Test Expo Booth # 1686, Stuttgart, June 2018

Automotive electronics is one of the largest growth sectors for electronics test equipment. Modern vehicles may contain up to 50 microprocessors embedded within systems that range from engine control and ABS to climate control and instrument display panels. Since the consequences of failure can, in some cases, be catastrophic the requirements for assembly quality and subsequent reliability are paramount.

JTAG Technologies products are used to detect faulty products the world over, in automotive component factories building ECUs, NightVision systems, Airbag controls, Telematics modules etc.These systems have tested boards and programmed devices in hundreds of thousands of vehicles used both on and offroads in every continent. We will showcase out of our wide range of products for the fast growing automotive market the following new solutions:

New enhanced Visualizer:
JTAG Visualizer Update Adds Features for Faster Debug
JTAG Technologies is excited to showcase the latest version of its acclaimed Visualizer graphical viewing tool for board (PCB) layouts and schematics. Allowing users to assess fault coverage data and pin-point production test faults in a snap.

Wide-ranging CAD support
With its wide range of CAD (EDA) tool import filters Visualizer is the number one choice for professional boundary-scan development and test engineers. Users can import schematic data direct from Mentor (Pads, DxDesigner, Capture) Cadence Altium and Zuken tools as well as board layout information in ODB++ and a dozen other vendor specific formats.

JTAG Maps
Introduced in this version of Visualizer the new Maps feature offers a basic test-accessibility view by a simple click of the mouse. The view can easily be fine-tuned by adding just a few key component descriptions to a look up table. What’s more using customisable colors to indicate test coverage levels or access types, a color-coded schematic can be displayed or printed. Once the design has been optimized for boundary-scan test coverage and committed to layout, final application development can begin in the JTAG ProVision developer tool.

Overcoming deficiencies in boundary-scan registers? CoreCommander
While many ICs are equipped with a JTAG (IEEE Std. 1149.1) boundary-scan register (BSR), a significant number of microprocessors and DSPs can be found with deficient or even non-existent BSRs. CoreCommander Micro uses the on-chip debug mode of processors to access ports and embedded peripheral controllers to promote ‘kernel-centric’ testing. Similarly, in the case of today’s Field Programmable Gate Arrays (FPGAs) test engineers can ‘bridge’ from the JTAG interface to the resources of the gate array itself.

Our CoreCommander FPGA product implements a ‘translator’ interface that allows our JTAG hardware to control embedded IP cores via a variety of bus interfaces (e.g. Wishbone, CoreConnect Avalon etc.). Amongst other benefits we name only a few here:

• Overcomes deficiencies in boundary-scan registers
• Works with devices not compliant to IEEE std 1149.x
• Most popular processor cores & FPGAs supported (ARM PPC etc.)
• Code compatible with Python for test scripting
• Low-cost compared to other solutions.

Our experts will be happy to discuss the level of integration variation according to your needs. See us on booth # 1686.

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